#[repr(u8)]pub enum UsbResumeInt {
NO_ASYNC_INT = 0,
SYNC_INT_GENERATED = 1,
}Variants§
NO_ASYNC_INT = 0
Not generated
SYNC_INT_GENERATED = 1
Generated because of the USB asynchronous interrupt
Implementations§
Source§impl UsbResumeInt
impl UsbResumeInt
Trait Implementations§
Source§impl Clone for UsbResumeInt
impl Clone for UsbResumeInt
Source§fn clone(&self) -> UsbResumeInt
fn clone(&self) -> UsbResumeInt
Returns a duplicate of the value. Read more
1.0.0 · Source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source. Read moreSource§impl Debug for UsbResumeInt
impl Debug for UsbResumeInt
Source§impl From<UsbResumeInt> for u8
impl From<UsbResumeInt> for u8
Source§fn from(val: UsbResumeInt) -> u8
fn from(val: UsbResumeInt) -> u8
Converts to this type from the input type.
Source§impl From<u8> for UsbResumeInt
impl From<u8> for UsbResumeInt
Source§fn from(val: u8) -> UsbResumeInt
fn from(val: u8) -> UsbResumeInt
Converts to this type from the input type.
Source§impl Ord for UsbResumeInt
impl Ord for UsbResumeInt
Source§fn cmp(&self, other: &UsbResumeInt) -> Ordering
fn cmp(&self, other: &UsbResumeInt) -> Ordering
1.21.0 · Source§fn max(self, other: Self) -> Selfwhere
Self: Sized,
fn max(self, other: Self) -> Selfwhere
Self: Sized,
Compares and returns the maximum of two values. Read more
Source§impl PartialEq for UsbResumeInt
impl PartialEq for UsbResumeInt
Source§impl PartialOrd for UsbResumeInt
impl PartialOrd for UsbResumeInt
impl Copy for UsbResumeInt
impl Eq for UsbResumeInt
impl StructuralPartialEq for UsbResumeInt
Auto Trait Implementations§
impl Freeze for UsbResumeInt
impl RefUnwindSafe for UsbResumeInt
impl Send for UsbResumeInt
impl Sync for UsbResumeInt
impl Unpin for UsbResumeInt
impl UnwindSafe for UsbResumeInt
Blanket Implementations§
Source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
Source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more