Struct Test 

#[repr(transparent)]
pub struct Test(pub u32);

TSI TEST Register. TSI_TEST_EN is asserted only by a full-register write of 0x55AA55AA, not by setting bit 0; writing bit 0 to zero disables test mode. DPD_TEST_EOSF is write-one-to-clear. CLKSOC_SEL and RUN_CTRL require ipt_test_mod=1; the referenced test guide is not supplied and CLKSOC_SEL values are reserved. This register model does not authorize hardware test operations.

Tuple Fields

0: u32

Implementations

impl Test

pub const fn tsi_test_en(&self) -> bool

TSI_TEST_EN. Encodings: 0: Test mode is disabled; 1: Test mode is enabled

pub const fn set_tsi_test_en(&mut self, val: bool)

TSI_TEST_EN. Encodings: 0: Test mode is disabled; 1: Test mode is enabled

pub const fn dpd_test_en(&self) -> bool

DPD_TEST_EN. Encodings: 0: IP is not entering dpd test mode; 1: IP is entering dpd test mode

pub const fn set_dpd_test_en(&mut self, val: bool)

DPD_TEST_EN. Encodings: 0: IP is not entering dpd test mode; 1: IP is entering dpd test mode

pub const fn dpd_test_eosf(&self) -> bool

End of Scan Flag in DPD test mode. Encodings: 0: Scan is not done in DPD test mode; 1: Scan is done in DPD test mode

pub const fn set_dpd_test_eosf(&mut self, val: bool)

End of Scan Flag in DPD test mode. Encodings: 0: Scan is not done in DPD test mode; 1: Scan is done in DPD test mode

pub const fn tsi_ana_test_setting(&self) -> u8

TSI_ANA_TEST_SETTING. Encodings: 0: Normal operation mode; 1: Test mode 1, Vref test; 2: Test mode 2, Vprechrg voltage test; 3: Test mode 3, Comparator test; 4: Test mode 4, Precharge function test; 5: Test mode 5, 4uA bias test; 6: Test mode 6, 2uA bias test; 7: Test mode 7, Function monitor test

pub const fn set_tsi_ana_test_setting(&mut self, val: u8)

TSI_ANA_TEST_SETTING. Encodings: 0: Normal operation mode; 1: Test mode 1, Vref test; 2: Test mode 2, Vprechrg voltage test; 3: Test mode 3, Comparator test; 4: Test mode 4, Precharge function test; 5: Test mode 5, 4uA bias test; 6: Test mode 6, 2uA bias test; 7: Test mode 7, Function monitor test

pub const fn clksoc_sel(&self) -> bool

CLKSOC_SEL

pub const fn set_clksoc_sel(&mut self, val: bool)

CLKSOC_SEL

pub const fn run_ctrl(&self) -> bool

RUN_CTRL. Encodings: 0: Gate analog switch clock; 1: Not gate analog switch clock

pub const fn set_run_ctrl(&mut self, val: bool)

RUN_CTRL. Encodings: 0: Gate analog switch clock; 1: Not gate analog switch clock

Trait Implementations

impl Clone for Test

fn clone(&self) -> Test

Returns a duplicate of the value.

fn clone_from(&mut self, source: &Self)

Performs copy-assignment from source.

impl Debug for Test

fn fmt(&self, f: &mut Formatter<'_>) -> Result

Formats the value using the given formatter.

impl Default for Test

fn default() -> Test

Returns the “default value” for a type.

impl PartialEq for Test

fn eq(&self, other: &Test) -> bool

Tests for self and other values to be equal, and is used by ==.

fn ne(&self, other: &Rhs) -> bool

Tests for !=. The default implementation is almost always sufficient, and should not be overridden without very good reason.

impl Copy for Test

impl Eq for Test

impl StructuralPartialEq for Test